capability
capability analysis
capable process
c-chart
central location
central tendency
characteristic
chi-square
coefficient of variance
common cause
control charts
control limits
Cp
Cpk
Cpl
Cpm
Cpu
Cr
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D
defect
defective
discrimination
dispersion
distribution
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E
estimated sigma
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H
histogram
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I
in control
individual control chart
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K
kurtosis
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L
lower control limit
lower specification limit
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M
maximum acceptable subgroup size
mean
measurement system
median
minimum acceptable subgroup size
mode
moving range
moving range chart
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negatively skewed distribution
nonconforming
nonconformities
nonnormal data
nonnormal data distribution
nonrandom pattern
normal curve
normal distribution
normal probability plot
np-chart
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observation
operational definition
outlier
out-of-control
overcontrol
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Pareto chart
p-chart
positively skewed distribution
Pp
Ppk
Ppl
Ppu
Pr
process
process capability
process performance
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random distribution
random sample
range
repeatability
reproducibility
run chart
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sample
sample size
sigma of the individuals
sigma
skewed distribution
skewness
special cause
specification limits
spread
stable process
standard deviation
statistical control
subgroup
symmetrical distribution
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target value
trial limits
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u-chart
undercontrol
uniform distribution
unstable system
upper control limit
upper specification limit
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variability
variables
variation
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X-bar
X-bar chart
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Zlower
Zmin
Zupper
Z value
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